X-ray Methods
Materials analysis using X-rays is rapidly developing. It can provide high element sensitivity, down to the detection of ppb, high spatial resolution, down to a few nanometers, structure sensitivity in the Angstrom regime, and/or chemical sensitivity for identifying the local chemical environment of atoms. Modern X-ray metrology techniques furthermore allow assessing the above at time resolutions down to the sub-second regime, especially when combined with Synchrotron Radiation.

Metrology
Nanotechnology is more and more exploiting these unique analytical features, especially in the structural investigation of complex functional materials at multiple length and time scales. An important quality is the ability to quantify the spectroscopic data collected in order to link it to the properties of the material; this usually includes the determination of the amounts of different phases or elements in multi-phase samples, but can also be the quantification of particular characteristics of single phases including for example a precise determination of crystal structure, valence state, or crystallite size and shape. While some X-ray based techniques such as X-ray fluorescence (XRF) analysis or X-ray diffraction (XRD) have established quantitative evaluation procedures and protocols, other, less routinely used methods provide more qualitative data (for example X-ray absorption spectroscopy or X-ray microscopy).

Workshops
The workshops each have a limited number of participants - register now!
The main aim of the workshop is to provide students and young researchers with the basics of some of the most common, but also some advanced X-ray based techniques for interrogating material properties. Special emphasis will be put on the quantitative character of the obtained data. Quantitative analysis requires good knowledge about the fundamental principles of the spectroscopic technique but also experience in using available software for data analysis.
During the workshops introductory lectures will provide these fundamentals followed by interactive sessions in which participants will be able to get hands-on experience with protocols and software for data analysis. The three parallel sessions will include workshops on:

• X-ray diffraction
• X-ray absorption spectroscopy
• X-ray small angle scattering
• X-ray fluorescence analysis
• Total reflection X-ray fluorescence analysis
• X-ray standing wave analysis

Host and Sponsors

Organisation:
Florian Meirer (UU), Frank de Groot (UU), Igor Makhotkin (UT), Andrei Petukhov (UU)

Contact: XRMworkshop2018(at)uu.nl