X-ray Methods
Materials analysis using X-rays is rapidly developing. It can
provide high element sensitivity, down to the detection of ppb, high
spatial resolution, down to a few nanometers, structure sensitivity
in the Angstrom regime, and/or chemical sensitivity for identifying
the local chemical environment of atoms. Modern X-ray metrology
techniques furthermore allow assessing the above at time resolutions
down to the sub-second regime, especially when combined with
Synchrotron Radiation.
Metrology
Nanotechnology is more and more exploiting these unique analytical
features, especially in the structural investigation of complex
functional materials at multiple length and time scales. An
important quality is the ability to quantify the spectroscopic data
collected in order to link it to the properties of the material;
this usually includes the determination of the amounts of different
phases or elements in multi-phase samples, but can also be the
quantification of particular characteristics of single phases
including for example a precise determination of crystal structure,
valence state, or crystallite size and shape. While some X-ray based
techniques such as X-ray fluorescence (XRF) analysis or X-ray
diffraction (XRD) have established quantitative evaluation
procedures and protocols, other, less routinely used methods provide
more qualitative data (for example X-ray absorption spectroscopy or
X-ray microscopy).
Workshops
The workshops each have a limited number of participants - register now!
The main aim of the workshop is to provide students and young
researchers with the basics of some of the most common, but also
some advanced X-ray based techniques for interrogating material
properties. Special emphasis will be put on the quantitative
character of the obtained data. Quantitative analysis requires good
knowledge about the fundamental principles of the spectroscopic
technique but also experience in using available software for data
analysis. During the workshops introductory lectures will provide
these fundamentals followed by interactive sessions in which
participants will be able to get hands-on experience with protocols
and software for data analysis. The three parallel sessions will
include workshops on:
- X-ray diffraction
- X-ray absorption spectroscopy
- X-ray small angle scattering
- X-ray fluorescence analysis
- Total reflection X-ray fluorescence analysis
- X-ray standing wave analysis
Poster session
After that participants who already use X-rays or are planning to do so in
the future will have the opportunity to discuss their projects and
scientific topics with the experts in the framework of a poster
session.
Invited lectures
On the second day invited lectures to the above mentioned
topics will be given by international experts in the field, showing
state-of-the-art applications with those methods.
Host and Sponsors
Organisation:
Florian Meirer (UU), Frank de Groot (UU), Igor Makhotkin
(UT), Andrei Petukhov (UU)
Contact: XRMworkshop2018(at)uu.nl
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